Search results for " Overlap Error"

showing 2 items of 2 documents

New Error Measures to Evaluate Features on Three-Dimensional Scenes

2011

In this paper new error measures to evaluate image features in three-dimensional scenes are proposed and reviewed. The proposed error measures are designed to take into account feature shapes, and ground truth data can be easily estimated. As other approaches, they are not error-free and a quantitative evaluation is given according to the number of wrong matches and mismatches in order to assess their validity

Ground truthFeature Detector Feature Descriptor Overlap Error Epipolar Geometry Feature Matching and ComparisonSettore INF/01 - InformaticaFeature (computer vision)business.industryEpipolar geometryFeature descriptorPattern recognitionArtificial intelligencebusinessFeature matchingMathematics
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Is There Anything New to Say About SIFT Matching?

2020

SIFT is a classical hand-crafted, histogram-based descriptor that has deeply influenced research on image matching for more than a decade. In this paper, a critical review of the aspects that affect SIFT matching performance is carried out, and novel descriptor design strategies are introduced and individually evaluated. These encompass quantization, binarization and hierarchical cascade filtering as means to reduce data storage and increase matching efficiency, with no significant loss of accuracy. An original contextual matching strategy based on a symmetrical variant of the usual nearest-neighbor ratio is discussed as well, that can increase the discriminative power of any descriptor. Th…

Settore ING-INF/05 - Sistemi Di Elaborazione Delle InformazioniSettore INF/01 - Informaticabusiness.industryComputer scienceImage matchingComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISIONScale-invariant feature transformPattern recognition02 engineering and technologySIFT sGLOH2 Quantization Binary descriptors Symmetric matching Hierarchical cascade filtering Deep descriptors Keypoint patch orientation Approximated overlap errorDiscriminative modelArtificial IntelligenceHistogramComputer data storage0202 electrical engineering electronic engineering information engineering020201 artificial intelligence & image processingComputer Vision and Pattern RecognitionArtificial intelligenceSIFTsGLOH2quantizationbinary descriptorssymmetric matchinghierarchical cascade filteringdeep descriptorskeypoint patch orientationapproximated overlap errorbusinessQuantization (image processing)SoftwareInternational Journal of Computer Vision
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